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. 2017 Sep 23;73(Pt 10):550–554. doi: 10.1107/S2053230X17012894

Table 2. Data-collection and processing information.

Values in parentheses are for the outer shell.

Diffraction source Beamline AR-NW12A, Photon Factory
Wavelength (Å) 0.978
Temperature (K) 100
Detector ADSC Quantum 210 CCD
Crystal-to-detector distance (mm) 150
Rotation range per image (°) 1
Total rotation range (°) 200
Exposure time per image (s) 1
Space group P4
a, b, c (Å) 75.36, 75.36, 91.01
α, β, γ (°) 90, 90, 90
Mosaicity (°) 0.18–0.29
Resolution range (Å) 50.00–2.00 (2.03–2.00)
Total No. of reflections 291560
No. of unique reflections 34452 (1710)
Completeness (%) 99.9 (100)
Multiplicity 8.5 (8.2)
I/σ(I)〉 79.8 (41.7)
R merge 0.107 (0.164)
Overall B factor from Wilson plot (Å2) 20.6

R merge = Inline graphic Inline graphic, where Ii(hkl) is the ith measurement and I(hkl) is the weighted mean of all measurements of I (hkl).