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. 2017 Oct 9;7:12826. doi: 10.1038/s41598-017-12896-1

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© The Author(s) 2017

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Far-field scattering plots showing the angles at which light is scattered back into the Si from the rear interface of the cell, for different incoming angles of light. The rear reflector used included 600 nm NSs embedded in an Ag film at the rear of semi-infinite Si. The array period of the NSs was 700 nm. The wavelengths selected were at resonances (A) and (B). Although the scattering patterns vary as the incoming angle of light does, significant large angle scattering is maintained across all cases.