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. Author manuscript; available in PMC: 2017 Oct 16.
Published in final edited form as: Adv Funct Mater. 2016 Dec 19;27(4):1604545. doi: 10.1002/adfm.201604545

Figure 5.

Figure 5

a) Elastic stretchability, b) buckling patterns, and c) sites of failure for device with coarse (Lspacing = 1.5 mm), medium (Lspacing = 1.25 mm), and dense (Lspacing = 1 mm) distribution of component islands and different interconnect amplitudes. The scale in (c) denotes the maximum principal strain in metal.