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. 2017 Oct 20;8:1065. doi: 10.1038/s41467-017-01132-z

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© The Author(s) 2017

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 4 — Diffraction patterns of AMH above 7.4 GPa. a X-ray and b neutron diffraction patterns of AMH, at RT and respective P of 10.3 and 8.6 GPa. The symbols are experimental data after subtraction of background and removal of the reflections from the diamond anvils in the neutron pattern. The purple solid lines are Le Bail (a) or full profile Rietveld (b) refinements using a mixture of $I m \bar{3} m$ ²⁹ and P4/nmm ³³ structures. The green line shows the difference between observed and calculated profiles. Sticks show the positions of Bragg reflections