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. 2017 Oct 26;7:14146. doi: 10.1038/s41598-017-14291-2

Figure 2.

Figure 2

(ac) XPS sputter depth profiles corresponding to PCT of 0, 15, and 40 h in Fig. 1(a–c), respectively. The films were etched with Ar+ ion beam of 1.0 keV.