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. 2017 Oct 26;7:14146. doi: 10.1038/s41598-017-14291-2

Figure 3.

Figure 3

SIMS depth profiles of SiON:H grown at a deposition temperature of 160 °C and N2O flow of 2 sccm. The blue lines are profiles before PCT, and the red lines are profiles after PCT of 30 h.