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. 2017 Jan 19;2017:2625132. doi: 10.1155/2017/2625132

Table 1.

Comparison of observed XRD data of thin films with the JCPDS cards. The film thickness, lattice type, crystallite size calculated by Scherrer formula, and contact angle are also summarized.

Thin film Film thickness (nm) Observed values Standard values hkl Phase Lattice Crystallite size Contact angle
2θ (°) d (Å) 2θ (°) d (Å) D (nm) (°)
TF1 160 27.74 3.22 27.68 3.22 101 CuS Hexagonal 11.92 96.60
29.48 3.03 29.28 3.05 102 CuS Hexagonal
31.76 2.80 31.79 2.81 103 CuS Hexagonal
48.24 1.89 47.94 1.90 110 CuS Hexagonal
59.64 1.55 59.35 1.56 116 CuS Hexagonal

TF2 380 28.16 3.18 27.95 3.19 662 Cu1.765S Cubic 10.80 107.83
32.26 2.76 32.27 2.77 1000 Cu1.765S Cubic
46.46 1.95 46.21 1.96 1420 Cu1.765S Cubic
54.80 1.67 54.79 1.67 1571 Cu1.765S Cubic

TF3 172 27.92 3.18 27.95 3.19 662 Cu1.765S Cubic 9.60 96.97
32.44 2.76 32.27 2.77 1000 Cu1.765S Cubic
46.62 1.95 46.28 1.96 220 Cu2S Cubic
54.78 1.67 54.79 1.67 1571 Cu1.765S Cubic