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. 2017 Jan 19;2017:2625132. doi: 10.1155/2017/2625132

Table 2.

Comparison of EDAX and XRD data.

Thin film Element C norm.
(wt.%)
C
error %
Cu/S ratio
(EDAX)
Cu/S ratio
(XRD)
TF1 Cu 52.24 0.2 1.094 1.000
S 47.76 0.2

TF2 Cu 63.89 0.6 1.769 1.765
S 36.11 0.5

TF3 Cu 64.13 0.6 1.788 1.765 and 2.000
S 35.87 0.4