Table 2.
Comparison of EDAX and XRD data.
| Thin film | Element | C norm. (wt.%) |
C error % |
Cu/S ratio (EDAX) |
Cu/S ratio (XRD) |
|---|---|---|---|---|---|
| TF1 | Cu | 52.24 | 0.2 | 1.094 | 1.000 |
| S | 47.76 | 0.2 | |||
|
| |||||
| TF2 | Cu | 63.89 | 0.6 | 1.769 | 1.765 |
| S | 36.11 | 0.5 | |||
|
| |||||
| TF3 | Cu | 64.13 | 0.6 | 1.788 | 1.765 and 2.000 |
| S | 35.87 | 0.4 | |||