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. 2017 Sep 25;2017:4198519. doi: 10.1155/2017/4198519

Figure 4.

Figure 4

EFM normalized force contrast on a 1 μm scan over a nanodielectric of εm = 4, εp = 10, rp = 25 nm, and ti = 20 nm and at 15 nm from upper and lower surfaces; inset: capacitance model of the nanodielectric comparing center to border scan line regions.