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. 2017 Oct 26;8:1822. doi: 10.3389/fpls.2017.01822

Table 1.

Description of the eight parental lines used for developing the MAGIC populations.

Parents Code Origin Agronomic relevance Resistance relevance
SAGC-08 A China Short grain, thickness stem Fe, Al, drought tolerance
HHZ 5-SAL 9-Y 3-Y 1 B IRRI-GSR Long grain, good grain quality Salt and Fe tolerance
BP1976B-2-3-7-TB-1-1 C Indonesia Long grain Zn tolerance, blast disease resistance
PR 33282-B-8-1-1-1-1-1 D Phil Rice Long grain, high yielding Al tolerance, bacterial blight resistance
FFZ1 E China Long grain, high yielding, large grain, good grain quality
CT 16658-5-2-2SR-2-3-6MP F CIAT Long grain, high yielding Bacterial blight resistance
IR 68 G IRRI Long grain, large grain, thickness stem Zn bacterial blight resistance
IR 02A127 H IRRI Long grain Comprehensive disease resistance