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. 2017 Oct 31;7:14422. doi: 10.1038/s41598-017-14825-8

Figure 4.

Figure 4

(a) Diffraction pattern of the AlN/sapphire interface. (b) Cross-sectional bright-field TEM image of the AlN structure/NPSS. TEM images with a two-beam condition along (c) g = 0002 and (d) g = 1–100.