Skip to main content
. 2017 Oct 3;10(10):1154. doi: 10.3390/ma10101154

Table 1.

Surface roughness Ra, µm and Rz, µm, and the average concentration of Cu, wt % in in situ alloyed Ti6Al4V (ELI)-1 at % Cu single layers manufactured with single scan (S) and rescan (R) manufacturing strategy.

Scanning Speed Ra, µm/Rz, µm/Cu, wt % at Hatch Distance
70 µm 80 µm 90 µm 100 µm
0.7 m/s, (S) 5 ± 0.7/25 ± 2.4/1.05 5 ± 0.1/34 ± 4.4/1.1 7 ± 0.7/38 ± 1.8/2.17 7 ± 0.4/46 ± 1.5/1.76
1.0 m/s, (S) 6 ± 0.6/39 ± 0.6/1.54 7 ± 0.6/42 ± 2.7/2.13 8 ± 1.0/44 ± 1.9/2.62 9 ± 0.2/51 ± 3.2/2.57
1.3 m/s, (S) 7 ± 0.8/38 ± 0.6/2.13 7 ± 0.7/45 ± 4.3/2.36 8 ± 0.6/51 ± 1.8/2.66 9 ± 0.3/54 ± 3.9/2.31
0.7 m/s, (R) 4 ± 0.1/25 ± 1.1/1.27 5 ± 0.7/27 ± 2.7/1.3 6 ± 0.3/36 ± 1.3/1.66 7 ± 1.2/40 ± 4.4/1.84
1.0 m/s, (R) 6 ± 0.9/36 ± 2.2/1.72 6 ± 0.9/36 ± 0.6/1.78 7 ± 1.4/40 ± 2.2/1.34 8 ± 0.5/51 ± 1.4/2.69
1.3 m/s, (R) 7 ± 0.3/37 ± 1.1/1.65 7 ± 0.5/37 ± 1.8/1.26 9 ± 0.5/50 ± 4.8/1.61 9 ± 1.0/51 ± 5.1/2.25