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. 2017 Oct 16;10(10):1181. doi: 10.3390/ma10101181
CCT Correlated Color Temperature
CSP Chip Scale Package
CSADT Constant-Stress Accelerated Degradation Test
LED Light-emitting Diode
SPD Spectral Power Distribution
SSADT Step-Stress Accelerated Degradation Test
WLCSP Wafer Level Chip Scale Packaging