Table 1.
Ellipsometry data for silicon wafers grafted with PEO-silane amphiphiles, the PEO-control and the siloxane control.
| Grafted Surface | Mn (g/mol) | Density ρ (g/mL) | Thickness h (nm) | Chain Density σ = (hρNA)/Mn (chains/nm2) | Graft Distance D = (4/πσ)1/2 (nm) | PEO Flory Spacing 2RF = 2aN3/5(nm) | Siloxane Flory Spacing 2RF = 2aN1/3 (nm) |
|---|---|---|---|---|---|---|---|
| PEO-control | 588 | 1.13 | 2.3 ± 0.2 | 2.60 | 0.70 | 2.4 | - |
| m = 0 | 749 | 1.02 | 1.4 ± 0.3 | 1.15 | 1.05 | 2.4 | - |
| m = 4 | 1044 | 1.00 | 1.6 ± 0.5 | 0.92 | 1.17 | 2.4 | 1.6 |
| m = 13 | 1710 | 0.98 | 1.5 ± 0.2 | 0.52 | 1.57 | 2.4 | 2.4 |
| m = 17 | 2006 | 0.99 | 2.0 ± 0.2 | 0.59 | 1.46 | 2.4 | 2.5 |
| m = 24 | 2524 | 0.98 | 2.8 ± 0.1 | 0.65 | 1.39 | 2.4 | 2.9 |
| m = 30 | 2968 | 0.98 | 2.9 ± 0.1 | 0.58 | 1.49 | 2.4 | 3.1 |
| Siloxane-control | 1286 | 1.01 | 2.5 ± 0.9 | 1.20 | 1.10 | - | 2.4 |