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. 2017 Nov 3;7:14611. doi: 10.1038/s41598-017-14449-y

Figure 5.

Figure 5

(a) Optical force exerted on a 100 nm (radius) high-refractive-index dielectric nanoparticle along x-axis the focal field with topological charge of 2. (b) Distribution of the corresponding potential depth along x-axis. (c) Force map superimposed on the intensity distribution of the vector focal field, indicating the anticlockwise rotation of the trapped particle.