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. 2017 Oct 11;17(10):2312. doi: 10.3390/s17102312

Figure 24.

Figure 24

SEM images from the sputtered ITO samples with annealing under vacuum (sample A), nitrogen (sample B), atmosphere (sample C) and no annealing (sample D); on the second row, AFM images for the similar thermal treatments. Reprinted from [111] with permission from Elsevier.