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. 2017 Sep 27;9(41):35947–35957. doi: 10.1021/acsami.7b07428

Figure 1.

Figure 1

XRD θ–2θ scans of 2-μm-thick PZT films grown on LNO/CNOns/glass: (a) Td of 450, 520, 560, and 600 °C and at 50 Hz and (b) 10, 25, and 50 Hz and with Td of 600 °C.