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. 2017 Nov 13;7:15392. doi: 10.1038/s41598-017-15331-7

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© The Author(s) 2017

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Ultraviolet photoelectron spectroscopy (UPS) analysis of the a-SIZO thin films with different Si contents. (a) Valence (E > 0) and conduction (E < 0) band edge spectra measured on 1SIZO, 2SIZO and 3SIZO film using UPS. The band edges onsets are indicated in the inset. (b) He II spectra of SECO and valence band edge with varying Si contents.