Table 3.

List of the calibration coefficients of the semiconductor detector in a combination of the target / filter. All conditions including 3 mm PMMA

W / 0.5 mm Al	Eeff (keV)	15.701	16.086	16.441	16.757	17.049	17.465
	Solidose 308	0.993	0.951	0.915	0.884	0.859	0.829
	Piranha	1.268	1.205	1.156	1.113	1.079	1.036
W / 0.025 mm Rh	Eeff (keV)	15.274	15.529	15.776	16.016	16.252	16.587
	Solidose 308	1.001	0.972	0.952	0.935	0.918	0.896
	Piranha	1.360	1.350	1.340	1.330	1.326	1.105
W / 0.05 mm Ag	Eeff (keV)	18.062	18.366	18.662	18.949	19.244	19.627
	Solidose 308	0.869	0.835	0.816	0.804	0.793	0.777
	Piranha	1.205	1.195	1.010	0.992	0.978	0.959
W / 0.075 mm Ag	Eeff (keV)	19.193	19.432	19.666	19.895	20.137	20.438
	Solidose 308	0.808	0.779	0.765	0.754	0.746	0.734
	Piranha	1.147	1.146	0.976	0.964	0.954	0.941
Mo / 0.03 mm Mo	Eeff (keV)	15.123	15.516	15.841	16.097	16.329	16.590
	Solidose 308	0.981	0.940	0.910	0.886	0.871	0.847
	Piranha	1.247	1.268	1.224	1.229	1.216	1.213
Mo / 0.025 mm Rh	Eeff (keV)	15.479	16.002	16.306	16.495	16.679	16.898
	Solidose 308	0.948	0.913	0.889	0.872	0.859	0.843
	Piranha	1.281	1.260	1.244	1.235	1.228	1.223