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. 2017 Oct 30;9(45):39105–39109. doi: 10.1021/acsami.7b06728

Figure 1.

Figure 1

(a) X-ray absorption characterization at Zn K-edge are shown for Zn(O,S) films deposited on Si substrates including references of Zn foil, ALD ZnO, and ZnS. Zn K-edge spectra were background subtracted and atomically normalized in the energy region from 9690 to 9700 eV. (b) Normalized derivative spectra of Zn K-edge.