Skip to main content
. 2017 Oct 30;9(45):39105–39109. doi: 10.1021/acsami.7b06728

Figure 3.

Figure 3

(a) X-ray absorption characterization at Zn LIII-edge is shown for Zn(O,S) films deposited on SiO2 including references of ALD ZnO and ZnS. Zn L-edge spectra were background subtracted and atomically normalized in the energy region from 1063–1073 eV. (b) Derivative absorption spectra at Zn LIII-edge showing that as the S concentration increases, so too does the ionicity of the system.