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. 2017 Oct 30;9(45):39105–39109. doi: 10.1021/acsami.7b06728

Figure 5.

Figure 5

(a) X-ray absorption characterization at Zn L-edges is shown for Zn(O,S) thin films deposited on SiO2 (i.e., S10_20:10% pulse ratio on SiO2 substrate, 20 cycles of deposition); (b) X-ray absorption characterization at Zn K-edges are shown for 33% pulse ratio thin films deposited on SiO2 (sample name S33_21) and nanoporous TiO2 (sample name T33_21).