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. 2017 Nov 6;10(11):1272. doi: 10.3390/ma10111272

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© 2017 by the authors.

Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).

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Negative-ion time of flight secondary ion mass spectrometry (ToF-SIMS) spectra (0–200 amu) of PANI film surfaces grown on glass substrates when using advanced APPJs device after 60 min deposition: (a) without I₂ doping; (b) with 30 s I₂ doping; and (c) with 120 s I₂ doping following deposition.

Negative-ion time of flight secondary ion mass spectrometry (ToF-SIMS) spectra (0–200 amu) of PANI film surfaces grown on glass substrates when using advanced APPJs device after 60 min deposition: (a) without I₂ doping; (b) with 30 s I₂ doping; and (c) with 120 s I₂ doping following deposition.