Figure 5.
Hidden in plain sight. Thermal patterning of nanoscale features with distinct topography but the same fluorescence intensity. (a) T-SPL patterning of the square of 30 × 30 μm2 at a pitch size of 60 nm. (b) Overlay of a second t-SPL pattern within the prepatterned square, containing the logos of the two institutes. (c) Fluorescence microscopy image of the patterned area acquired under irradiation with UV light, showing that the features programmed in topology mode are virtually invisible in fluorescence microscopy mode.