Skip to main content
. 2017 Dec 7;11:665. doi: 10.3389/fnins.2017.00665

Table 2.

Comparison of etching techniques employed for the fabrication of electrodes for neural recording.

Wet chemical etching Dry etching Electrolytic etching
Isotropic Anisotropic
Methods
  • Wet chemical baths, vapors

  • Chemical

  • Wet chemical baths, Vapors

  • Chemical

  • Plasma etching

  • Gas phase etching

  • Reactive ion etching

  • Deep reactive ion etching

  • Physical, chemical-physical

  • Wet chemical baths with the application of electric potential

  • Electrochemical

Properties
  • Uniform material removal

  • Rounded shapes

  • High etch rates

  • Material removal with different rates in areas of different crystallographic orientation or doping level

  • Great process control

  • Etch stop possibility

  • Etch rates dependent on temperature and concentration

  • Undercutting

  • Isotropic, Anisotropic

  • Deep etching

  • Minor broadening and undercutting

  • CMOS compatible

  • Repeatable

  • Possibility to form structures with vertical sidewalls and small features

  • Combination of electrical and chemical reactions causing anodic dissolution of metals under the application of voltage between material and counter electrode

Materials/Solutions
  • Silicon: HF, HF/HNO3/CH3COOH

  • Silicon nitride: H3PO4

  • Tungsten: HF /HNO3

  • Aluminum: H2O/HF; HCl/HNO3 /HF

  • Platinum, Iridium: HCl /HNO3

  • Silicon: KOH, NaOH, EDP, TMAH

  • Silicon: XeF2; RIE- CF4, SF6; DRIE- SF6/C4F8

  • Polymers: O2, F2 – based plasmas

  • Silicon: solutions containing HF

  • Tungsten: KOH, NaOH,

  • Platinum, Iridium: CaCl2, HCl, NaCl, KCl, NaOH, KCN

Application in fabrication of neural electrodes
  • Two stage etching in the formation of Utah electrode arrays: pillar thinning dynamic etch and static- sharpening etch (Bhandari et al., 2010a)

  • Smoothening of roughness induced during dicing and WEDM in Utah electrode arrays (Rakwal et al., 2009)

  • Etching of buried microfluidic channels in planar probes (Cheung et al., 2003)

  • Edges smoothening (Grand et al., 2011)

  • Releasing electrodes from the substrate (Chen C. H. et al., 2009)

  • Thickness and shape definition of planar probes (Najafi et al., 1990; Lin and Pisano, 1999; Yao et al., 2007)

  • Releasing planar electrodes from the wafer (Edell et al., 1992)

  • Shaping electrodes accordingly to crystallographic planes (Xiao-Hong et al., 2007)

  • Thickness and outline definition of SOI-based planar electrodes (Norlin et al., 2002)

  • Main removal technique in polymer-based neural interfaces (Kim and Meng, 2015)

  • Release of planar electrodes from the wafer (Suzuki et al., 2003; Fernández et al., 2009; Chung et al., 2015)

  • Formation of macroporous and lattice structures promoting neuronal ingrowth (Wise et al., 2008)

  • Roughening of probes' surface (Chen et al., 2014; Zhang et al., 2014)

  • Deinsulation of recording sites (Yao et al., 2006)

  • Sharpening metal wires for microwire electrodes using DC voltage for sharp hyperbolical tips, or AC-voltage for larger, angled conical shapes up to tens of nanometers (Grundfest et al., 1950; Chang et al., 2012)

  • Electropolishing to smoothen surfaces and thin wire-based probes (Lalanne et al., 2011)

  • Formation of porous silicon used as on-probe biomolecular filtering element, sacrificial layer, or dissolvable stiffening material (Bell and Wise, 1998; Hajj-Hassan et al., 2012; Sun et al., 2016)