Table 1. Diffraction data statistics of crystal grown in condition C6 ( Figure 1C).

Diffraction source	ALS BL 4.2.2
Wavelength (Å)	1.001
Temperature (K)	100
Detector	CMOS
Crystal-to-detector distance (mm)	200
Rotation range per image (°)	0.106
Total rotation range (°)	190
Space group	P 1 2 1
a, b, c (Å)	82.58, 86.85, 89.03
α, β, γ (°)	90.00, 115.39, 90.00
Resolution range (Å)	59.01–1.8 (1.9–1.8)
Total No. of reflections	315601 (30716)
No. of unique reflections	94930 (9801)
Completeness (%)	91.5 (64.8)
Multiplicity	3.3 (3.1)
<I/σ(I)>	11.2 (2.2)
R meas	8.7 (80.4)