Refinement on F2	Secondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.030	Hydrogen site location: difference Fourier map
wR(F2) = 0.079	H atoms treated by a mixture of independent and constrained refinement
S = 1.11	w = 1/[σ2(Fo2) + (0.0445P)2 + 0.3065P] where P = (Fo2 + 2Fc2)/3
2789 reflections	(Δ/σ)max = 0.001
176 parameters	Δρmax = 0.54 e Å−3
8 restraints	Δρmin = −0.24 e Å−3
Primary atom site location: structure-invariant direct methods