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. 2017 Dec 8;10(12):1406. doi: 10.3390/ma10121406

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© 2017 by the authors.

Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).

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Structural and morphological characterization of samples. SEM images of (a) NiF; (b) NiT; (c) FLG on Ni; (d) 4MLG on Ni; (e) Large-scale STM topography (100 × 100 nm²) of few-layers graphene grown on Ni (I = 0.7 nA, V_BIAS = 0.1 V). High-magnification STM image (2.5 × 2.5 nm²) showing the triangular lattice atomic structure of few-layer graphene on Ni with lattice constant 2.4 Å, according to Fourier transform analysis (inset). Representative Raman spectra of SLG grown on Cu (for reference) (f), 4MLG tranferred on Ni (g) and FLG grown on Ni (h). Background caused by the luminescence of the copper was subtracted in the case of SLG grown and transferred on Cu.