Table 2.
Summary of MoS2 gas sensing devices, target chemical compounds and performances. RT stands for room temperature (1 in N2 atmosphere; 2 in Ar atmosphere; 3 in presence of a relative humidity (RH) of 30%; 4 in presence of a relative humidity (RH) of 45%).
Ref. | Material | Growth Technique | Device Type | Gas and Temperature | Performances |
---|---|---|---|---|---|
[58] | MoS2 | CVD | Resistive | NH3-RT NO2-RT |
<2%@20ppm ≈27%@20ppm |
[59] | MoS2 | CVD | Resistive | NO2-RT | ≈120%@1ppm 1 |
[61] | MoS2 | Mechanical Exfoliation | FET | NH3-RT NO2-RT |
≈50%@200ppm 1 ≈400%@20ppm 1 |
[65] | MoS2 | CVD | FET | NH3-RT NO2-RT |
≈50%@200ppm 2 ≈50%@100ppb 2 |
[66] | MoS2 | Liquid Exfoliation | Resistive | NO2-200 °C | 5.8@1ppm |
[68] | MoS2 + Pd NPs | Drop Casting + Evaporation | Resistive | H2-RT | ≈35%@1% |
[69,70] | MoS2/Si | Magnetron Sputtering | Resistive pn junction | NH3-RT H2-RT |
≈300%@50ppm 15.4%@5000ppm 3 |
[71] | MoS2 + ZnO | Hydrothermal | Resistive | Ethanol-260 °C | 42.8@50ppm |
[72] | MoS2 | Hydrothermal | Resistive | NO2-150 °C | 78%@50ppm |
[73] | MoS2 Porous | Sputtering + Film Conversion | Resistive | Ethanol-RT | ≈2%@1ppm 1 |
[74] | MoS2/GO QDs | Exfoliation + Sonication | Resistive | NO2-RT NH3-RT |
≈35%@10ppm 1 ≈20%@10ppm 1 |
[76] | MoS2 Flakes | Sonication | Resistive | NO2-100 °C CNH3-100 °C |
≈10%@10ppm 1 ≈35%@10ppm 1 |
[77] | SnO2@MoS2 | Hydrothermal | Resistive | Ethanol-280 °C | ≈50@50ppm |
[78] | SnO2@MoS2 | Hydrothermal | FET | NO2-RT | ≈28%@10ppm |
[79] | MoS2@TiO2 | Hydrothermal | Resistive | Ethanol-150 °C | 14.2@100ppm 4 |
[80] | MoS2/rGO | Hydrothermal | Resistive | NO2-RT | ≈60%@2ppm |
[81] | MoS2 | Liquid Exfoliation | FET | NO2-RT | ≈11%@1ppm 1 |