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letter
. 2017 Nov 19;591(23):3850–3860. doi: 10.1002/1873-3468.12898

Figure 4.

Figure 4

Reliability of the extended beta distribution fit. (A) I app of KcvNTS at 1 m KCl as obtained with the 1‐kHz filter (black circles) or from filtering the 10‐kHz data from Meca‐4 chips to ca. 1 kHz by a moving average filter (blue circles). I OF as determined by the extended beta distribution fit with 1‐kHz filter [Eqn (1)], open black circles, n = 3) and I OF directly measured with the 10‐kHz filter (open red circles n = 4). (B) Representative current traces of KcvNTS in 1 m KCl filtered at 10 kHz. Closed channel and I OF are labeled as C and OF, respectively. (C) Current I app measured at 1 kHz for KcvNTS at 0.1 m (black) and 1.5 m KCl (blue) compared with I app (gray and orange) as calculated from averaging over O‐M and O‐F gating [Eqn (2)]. Mean and standard deviation of 6 and 3 experiments at 0.1 and 1.5 m, respectively.