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. 2017 Dec 8;2(12):8770–8778. doi: 10.1021/acsomega.7b01404

Figure 3.

Figure 3

Atomic force microscopic images (area: 1.0 μm × 1.0 μm) recorded for (a) OT-immobilized Si/SiO2 (OT wafer) (ρ = 2.9 Å), (b) OT wafer + 1 nM Zn2+ solution (ρ = 4.8 Å), and (c) OT wafer + 1 nM Cu2+ solution (ρ = 2.0 Å).