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. 2018 Jan 10;13:8. doi: 10.1186/s11671-017-2419-8

Fig. 12.

Fig. 12

a, b Experimental I (V) characteristics for Electroforming, Set, and Reset processes measured on a large number of memory elements to understand the device-to-device variability. The experimental device-to-device variability is accounted for in Monte Carlo simulations with a ± 5% standard deviation on parameters α and Lx [21]