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. 2018 Jan 12;8:640. doi: 10.1038/s41598-017-18593-3

Figure 5.

Figure 5

(ae) Typical cyclic voltammetric response of the pErGO-based solid-state device at different scan rates starting from 0.01 V s−1 to 100 V s−1. (f) The dependence of specific capacitance on scan rate is shown with a semi log plot.