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. 2018 Jan 12;8:640. doi: 10.1038/s41598-017-18593-3

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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(a,b) EIS analysis of the fabricated supercapacitor device; (a) shows Nyquist plot recorded in the frequency range of 100 kHz to 0.01 Hz and (b) shows the Bode plot of the device at different bending angles. (c) Durability test of the device recorded in the form of % retention of capacitance with the number of cycles. Inset shows the optical image of the device at different bending angle and corresponding stability data are given. (d) Nyquist plot before and after 5000 cycles.