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. 2018 Jan 16;8:861. doi: 10.1038/s41598-017-19129-5

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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(a) Resistance and TAMR vs. θ (position of the sample) with the field rotating from OOP, θ = 0,180° to IP θ = 90,270°. (b) Resistance vs. rotation of the sample with the field applied IP. Both measurements were taken at 9 T, 10 K and V of 900 mV. Measurement configurations on the left. (c) TAMR vs. temperature (calculated from resistance vs. rotation curves) and (d) resistance vs. temperature of 2 nm and 4 nm-thick barrier samples with magnetic field applied OOP (red, blue) and IP (black, green).