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. 2017 Dec 27;6:e33442. doi: 10.7554/eLife.33442

Table 2. EM data collection, processing, and refinement statistics.

Data collection and processing
Voltage (kv) 300
Magnification 290,000x
Defocus (μm, nominal) −1.0 to −2.5
Pixel size (Å) 1.02
electron dose rate (counts/pixel/s) 10
Total electron dose (e-2) 80
Exposure time (s) 8
Number of images (collected/processed) 3900/3024
Number of frames per image 40
Initial particle number 1,843,269
Particle number for 3D classification 1,267,674
Final particle for refinement 937,118
Resolution (masked/unmasked) (Å) 4.0/4.2
Map sharpened b-factor (Å2) −233
Model refinement
r.m.s. deviation (bonds) 0.005
r.m.s. deviation (angles) 0.97
All-atom clashscore 2.30
Ramachandran plot
Outliers (%) 0.00
Allowed (%) 4.59
Favored (%) 95.81
CaBLAM analysis:
Outliers (%) 1.92
Disfavored (%) 6.65
Ca outliers (%) 0.11
Rotamer outliers (%) 0.00