Table 2.

Crystal thicknesses measured and calculated from the depth of the quenched crystallised films annealed for 120 mins using the conventional XRD method at a diffraction angle, 2θ, varying between 10 and 40°.

Peaks	XRD – Quenched crystallised PEEK film annealed for 120 mins
	Run 1			Run 2
	2θ	FHWM	Crystal Thickness (nm)	2θ	FHWM	Crystal Thickness (nm)
[110]	18.7	0.648	13.8	18.7	0.669	13.4
[111]	20.6	0.889	10.1	20.6	1.391	6.4
[200]	22.5	0.913	9.8	22.5	1.062	8.5
[211]	28.5	1.123	8.1	28.6	1.168	7.8