Fig. 2. TEM analysis of thin films of TMA deposited onto freestanding graphene. (a1) to (d1), Brightfield TEM images of TMA thin films of increasing deposition time as marked, with corresponding SAED patterns (a2) to (d2) on which graphene and TMA diffraction peaks are labelled. (e) TMA film thickness, as measured by AFM, with deposition time. (f) Azimuthal line profiles of the diffraction intensity through the TMA {11} diffraction peaks, as labelled by the dashed arc on (b2); here 0° is defined by the graphene {01} spots. (g) Modulation of diffraction intensity, ΔI/I0 along TMA {11} azimuths, as a function of film thickness.
