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. Author manuscript; available in PMC: 2018 Jan 30.
Published in final edited form as: Pattern Recognit Lett. 2016 Dec 19;86:76–81. doi: 10.1016/j.patrec.2016.12.012

Fig. 1.

Fig. 1

x axis is tuning parameter λC under log scale and y axis is the distance between truth and estimations; λA is increasing proportionally with λC. One can see that in both the low dimensional and hight dimensional setting, estimation accuracies for A and C first increase then decrease as penalty increases.