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. 2018 Jan 3;11(1):65. doi: 10.3390/ma11010065

Figure 5.

Figure 5

Atomic Force Microscopy (AFM) three-dimensional (3D) and two-dimensional (2D) “height trace” image of untreated Apuan marble and Ajarte limestone and treated with WNC and ANC and values of root mean square roughness (RMSR) (nm).