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. 2018 Jan 31;19(1):76–100. doi: 10.1080/14686996.2017.1422224

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© 2018 The Author(s). Published by National Institute for Materials Science in partnership with Taylor & Francis

This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Figure 19. — (a) Cross-sectional back-scatter scanning electron microscopy image of the crystal grain, including a CaSi₂F_x compound. (b) Electron probe micro-analysis along the red arrow in (a). (c–f) STEM-EDX elemental mapping results of the CaSi₂F₂ composition region. (f) Overlay of Si, Ca, and F mapping. (g) HAADF-STEM image of the STEM-EDX elemental mapping area. Copyright (2016) by the Nature Publishing Group.