Table 2. Cryo-EM data collection, refinement, and validation statistics.
| Class 5 (EMD-3931) |
Class 6 (EMD-3930) |
Class 7 (EMD-3929) |
Class 8 (EMD-3926) |
Class 9 (EMD-3925) |
|
|---|---|---|---|---|---|
| Data collection and processing | |||||
| Magnification | 75 000 | 75 000 | 75 000 | 75 000 | 75 000 |
| Voltage (kV) | 300 | 300 | 300 | 300 | 300 |
| Electron exposure (e–/Å2) | 100 | 100 | 100 | 100 | 100 |
| Defocus range (μm) | -1.0 – -4.0 | -1.0 – -4.0 | -1.0 – -4.0 | -1.0 – -4.0 | -1.0 – -4.0 |
| Pixel size (Å) | 1.4 | 1.4 | 1.4 | 1.4 | 1.4 |
| Symmetry imposed | C1 | C1 | C1 | C1 | C1 |
| Initial particle images (no.) | ~100 000 | ~100 000 | ~100 000 | ~100 000 | ~100 000 |
| Final particle images (no.) | 25 000 | 14 000 | 14 000 | 16 000 | 9 000 |
| Map resolution (Å) | 8.0 | 10.5 | 10.5 | 10.5 | 8.5 |
| FSC threshold | |||||
| Map resolution range (Å) | 8.0 - 15 | 9.0 - 15 | 9.0 - 15 | 10.0 - 15 | 9.0 - 15 |