Skip to main content
. Author manuscript; available in PMC: 2019 Feb 13.
Published in final edited form as: Lab Chip. 2018 Feb 13;18(4):639–647. doi: 10.1039/c7lc01113j

Fig. 3.

Fig. 3

Measured average surface roughness as a function of layer exposure time. The error bars indicate the standard deviation of the three measurements for each exposure time that are described in Sect. 2.3. Inset: microscope photo of device with adjacent regions having 600 and 800 ms layer exposure times. Faint pixelation is more observable for the former than the latter.