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. 2018 Feb 15;8:3093. doi: 10.1038/s41598-018-21572-x

Figure 2.

Figure 2

Electrochemical performance of stacked device against single device: (a) CV profiles at 100 mV s−1, (b) GCD profiles at 3 A g−1, (c) Nyquist plot with inset showing magnified version at low-frequency region, and (d) performance durability test at 3 A g−1.