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. 2018 Feb 16;8:3204. doi: 10.1038/s41598-018-21420-y

Figure 3.

Figure 3

Atomic force micrographs of (a) InAs microribbon, (b) SANE photoresist pattern on InAs microribbon (inset: SEM and AFM images of 50-nm PR lines), (c) InAs NWs (inset: SEM and AFM images of 35-nm InAs NWs), (d) Transmission electron micrograph of the InAs NWs transferred onto Si/SiO2.