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. 2018 Feb 26;9:835. doi: 10.1038/s41467-018-03316-7

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© The Author(s) 2018

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 3 — Evolution of pores during the closure. TEM images show FIB-prepared cross-sections at different fluence stages of pore closure, after low-flux irradiation of am-AAO sample on Si substrate with 25 keV He⁺. Irradiation fluence from (a-e): 0, ~5 × 10¹⁴, ~2 × 10¹⁵, ~3 × 10¹⁵, and ~2 × 10¹⁶ ions cm⁻². The red arrows follow the mass-flow pattern. The scale bar is 50 nm