Figure 1. Scanning electron microscopy (SEM) images and size distribution (number-based) of wear debris from polyether-ether-ketone (PEEK) and cobalt-chromium-molybdenum (CoCrMo) groups.

(A and C) SEM images of PEEK wear debris in two magnification fields (A. magnification 1000×, C. magnification 10,000×). (B and D) SEM images of CoCrMo wear debris in two magnification fields (B. magnification 1000×, D. magnification 10,000×). (E) Size distribution of PEEK and CoCrMo particles, as determined using SEM.