Fig. 5.

Resistance evolution based on the analytic model. (A and B) Linear correlations between $R$ and ${\eta }^2/N_{CNT}$ in both x and z directions are shown based on the CGMS simulation results. The simulation results are for $N_{CNT}=135$ CNTs with length $l_{CNT}=\mathrm{2,400}\hspace{0.17em}\text{nm}$ and diameter $d_{CNT}=1\hspace{0.17em}\text{nm}$, each discretized by $N_{\text{node}}=120$ nodes, in a simulation cell with $H_x=H_z=\mathrm{1,200}\hspace{0.17em}\text{nm}$. The dashed lines are fitting curves $R=0.125R_{\text{contact}}{\eta }^2/N_{CNT}$. (C and D) Analytic results of the evolution of the relative change of resistances $\mathrm{\Delta }{R}_x/R_{x0}$ and $\mathrm{\Delta }{R}_z/R_{z0}$ under three sequentially increasing strain cycles of 20, 40, and 60% based on Eqs. 1–4. The analytic results are for $N_{CNT}=135$ CNTs corresponding to the CGMS simulation in Fig. 2 C and D.