Skip to main content
. Author manuscript; available in PMC: 2018 Mar 12.
Published in final edited form as: Chem Commun (Camb). 2017 Jun 13;53(48):6516–6519. doi: 10.1039/c7cc02631e

Fig. 1.

Fig. 1

(a) RBS spectra (6 MeV particle energy, beam of 4He) of Si-deposited samples of bulk UiO-66 which were exposed to PSE conditions for time periods as indicated. Shown is the response from the beam particles scattered by iodine; inset: normalized zirconium reference signals. (b) RBS spectra (11 MeV particle energy, beam of 12C) of UiO-66@Si samples which were exposed to PSE conditions for time periods as indicated. (c) Logarithmic plot of the concentration of introduced I-bdc vs. PSE time. Black squares are the results from 1H NMR measurements, (relative to the total linker amount). The blue and red dots are the results from the RBS experiments of the drop-cast bulk and UiO-66@Si samples, respectively (given relative to the Zr content).‡