FIG. 11.
(a) Cross-sectional TEM image of the tin nitride sample at low magnification. (b) High-resolution TEM image of the sample showing three separate grains/areas with different contrast. (c) Representative SAED pattern from the SnN1−δ area in (a), showing diffraction spots on two rings with small d-spacing (indicated by dashed circles), and several rings with large d-spacing, consistent with XRD in Fig. 5(a). (d) Representative FFT of the single-contrast shown area in (b), showing that small regions of the material are single crystals.